Low power and low timing jitter phase-lock loop and method

ABSTRACT

A phase-lock loop generates an output clock signal from an input clock signal. The output clock signal is coupled through a clock tree and is fed back to a phase detector, which compares the phase of the output clock signal to the phase of the input clock signal. The output clock signal is generated by a voltage controlled oscillator having a control input coupled to receive an output from the phase detector, and a frequency multiplier coupled to the output of the voltage controlled oscillator. As a result, the CLK OUT  signal generated by the frequency multiplier has a relatively high frequency while the voltage controlled oscillator, by operating at a relatively low frequency, uses relatively little power.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.11/716,515, filed Mar. 9, 2007, U.S. Pat. No. 7,436,231, which is adivisional of U.S. patent application Ser. No. 11/394,506, filed Mar.31, 2006, U.S. Pat. No. 7,276,945, which is a continuation of U.S.patent application Ser. No. 10/868,284, filed Jun. 14, 2004, U.S. Pat.No. 7,042,260.

TECHNICAL FIELD

This invention relates to phase-lock loops for generating one or moreclock signals from an input clock signal.

BACKGROUND OF THE INVENTION

Periodic digital signals are commonly used in a variety of electronicdevices. Probably the most common of periodic digital signals are clocksignals that are typically used to establish the timing of a digitalsignal or the timing at which an operation is performed on a digitalsignal. For example, data signals are typically coupled to and frommemory devices, such as synchronous dynamic random access memory(“SDRAM”) devices, in synchronism with a clock or data strobe signal.

As the speed of memory devices and other devices continue to increase,the “eye” or period in which a digital signal, such as a data signal, isvalid becomes smaller and smaller, thus making the timing of a strobesignal or other clock signal used to capture the digital signal evenmore critical. In particular, as the size of the eye becomes smaller,the propagation delay of the strobe signal can be different from thepropagation delay of the captured digital signal(s). As a result, theskew of the strobe signal relative to the digital signal can increase tothe point where a transition of the strobe signal is no longer withinthe eye of the captured signal.

One technique that has been used to ensure the correct timing of astrobe signal relative to captured digital signals is to use aphase-lock loop (“PLL”) to generate the strobe signal. In particular, aphase-lock loop allows the timing of the strobe signal to be adjusted tominimize the phase error between the strobe signal and the valid eye ofthe digital signal. For example, as shown in FIG. 1, a conventionalphase-lock loop 10 receives an input clock signal CLK_(IN) and generatesan output clock signal CLK_(OUT) from the CLK_(IN) signal. Thephase-lock loop 10 includes a phase detector 12 that receives the inputclock CLK_(IN) signal and compares the phase of the CLK_(IN) signal tothe output clock signal CLK_(OUT). The phase detector 12 generates anerror signal V_(E) that is indicative of the phase error between theCLK_(IN) signal and the CLK_(OUT) signal. This error signal V_(E) isapplied to a loop amplifier 14, which normally has a relatively highgain. The loop amplifier 14 generates an amplified error signal V_(E+)

Although the V_(E) signal has a relatively low frequency componentindicative of the phase error between the CLK_(IN) and CLK_(OUT)signals, it also normally includes harmonics of the CLK_(IN) andCLK_(OUT) signals. As explained below, these harmonics would cause thephase of the CLK_(OUT) signal to periodically vary at a high frequency,which is a trait known as “phase noise.” To minimize the phase noise,the amplified V_(E) signal is applied to a loop filter 16, which isnormally a low-pass filter having a cutoff frequency that is well belowthe frequency of the CLK_(IN) signal. The loop filter 16 thereforegenerates a relatively low frequency control signal V_(CON) that isapplied to a voltage controlled oscillator (“VCO”) 20. A singlecomponent, such as an operational amplifier (not shown), is often usedfor both the loop filter 16 and the loop amplifier 14. The VCO 20generates the CLK_(OUT) signal with a frequency that is proportional tothe magnitude of the V_(CON) signal.

In operation, the closed-loop nature of the phase-lock loop 10 causesthe phase of the CLK_(OUT) signal from the VCO 20 to be adjusted so thatthe phase of the CLK_(OUT) signal differs from the phase of the CLK_(IN)by a phase error that causes the V_(CON) signal to have a magnitude thatmaintains the frequency of the CLK_(OUT) signal equal to the frequencyof the CLK_(IN) signal. In general terms, a small phase error can bemaintained by using a loop amplifier 14 having a larger gain since agiven phase error will produce a larger control voltage V_(CON).

Another conventional phase-lock loop 30 is shown in FIG. 2. Thephase-lock loop 30 is substantially identical in structure and operationto the phase-lock loop 10 of FIG. 1. Therefore, in the interest ofbrevity, identical components have been provided with the same referencenumerals, and an explanation of their function and operation will not berepeated. The phase-lock loop 30 differs from the phase-lock loop 10 byincluding a frequency divider 34 in the signal path from the VCO 20 tothe phase detector 12. The frequency divider 34 is programmable toreduce the frequency of the CLK_(OUT) signal by dividing it by anyinteger value N. Therefore, if the CLK_(OUT) signal has a frequency ofF₀, the signal fed back to the phase detector 12 will have a frequencyof F₀/N.

In operation, the closed loop nature of the phase-lock loop 30 willcause the V_(CON) signal to have a value that ensures that the frequencyof the signals applied to the phase detector 12 are equal to each other.Thus, if the CLK_(IN) signal has a frequency of F_(IN), the frequencyF₀/N of the signal fed back to the phase detector 12 will also beF_(IN), i.e., F₀/N=F_(IN). Solving this equation for F₀, it can be seenthat F₀=N*F_(IN), i.e., the CLK_(OUT) signal will have a frequency thatis an integer multiple of the frequency of the CLK_(IN) signal.

Although phase-lock loops have been successful in allowing digitalsignals to be captured in a digital device operating at a high speed,they are not without their disadvantages. In particular, phase-lockloops can consume a great deal of power, which can be a significantdisadvantage in certain applications, such as in battery powered deviceslike laptop computers. The magnitude of the power consumed by phase-lockloops is a function of several parameters. In general, the powerconsumed by a phase-lock loop is directly proportional to the frequencyof the signal generated by the loop since power is consumed each time atransistor is switched between two logic levels. Unfortunately, a highoperating frequency is needed to match the high operating speed ofdigital devices, thus making it impractical to minimize powerconsumption. Also, a high operating frequency has the advantage ofreducing the time required for the phase-lock loop to achieve a lockedcondition.

Phase-lock loops can also exhibit problem other than those related topower consumption. A clock signal produced by a phase-lock loop can havean unacceptable amount of phase noise, particularly if the loopamplifier 14 has a high gain, which, as explained above, is desirable toprovide good phase control. While phase noise can be reduced by reducingthe frequency response of the loop filter 16, doing so can reduce theability of the loop to respond to variations in the frequency of theCLK_(IN) signal and may unduly increase the time required for the loopto achieve lock.

The effect of phase noise and other noise sources can be explained withreference to the phase-lock loop shown in FIG. 3, which is thephase-lock loop 30 of FIG. 2 to which noise sources θ_(N1), θ_(N2), andθ_(N3) have been added. Also shown in FIG. 3 are the gain of the phasedetector 12 as K_(Φ), the transfer function of the loop amplifier 14 asZ_(F)(S), and the transfer function of the VCO 20 as K_(VCO)/S. Thenoise source θ_(N1) is the phase noise in the CLK_(IN) signal, which canresult, for example, from variations in power supply voltage. The noisesource θ_(N2) is electrical noise in the loop filter 16, which canresult, for example, from cross coupling of signals in the loop filter16. The noise source θ_(N3) is phase noise in the voltage controlledoscillator 20. The open loop gain G(S) of the phase-lock loop 30 isgiven by the formula G(S)=K_(Φ)Z_(F)(S)K_(VCO)/S, and the transferfunction between all of these noise sources and the output signalCLK_(OUT), can be expressed by the following formulae:H _(N1)(S)=NG(S)/(1+G(S))  (Graph 1)H _(N2)(S)=K _(VCO) /S(1+G(S))  (Graph 2)H _(N3)(S)=1/(1+G(S))  (Graph 3)

Graphs for these formulae are shown in FIG. 4. As explained below,similar graphs for an embodiment of the invention can be favorablycompared to these graphs.

There is therefore a need for a phase-lock loop that can operate at ahigh frequency and yet consume relatively little power, and can operateover a wide frequency range and relatively quickly achieve a lockedcondition.

SUMMARY OF THE INVENTION

A phase-lock loop and method is used to generate an output clock signalresponsive to an input clock signal. The phase-lock loop includes aphase detector that generates a phase error signal indicative of arelationship between the phase of the input clock signal and the phaseof the output clock signal. The phase-lock loop also includes a voltagecontrolled oscillator that generates a clock signal having a frequencycorresponding the phase error signal. However, the clock signal from thevoltage controlled oscillator is not used as the output clock signal.Instead, the clock signal from the voltage controlled oscillator iscoupled to a frequency multiplier that generates the output clock signalwith a frequency that is a multiple, such as an integer multiple, of thefrequency of the clock signal generated by the voltage controlledoscillator. The voltage controlled oscillator may be a ring oscillatorformed by a plurality of delay elements that are coupled to each otherin a ring and have a respective delay control terminal that controls thesignal propagation delay through the delay element. The delay controlterminal of each of the delay elements is coupled to the output of thephase detector so that the signal propagation delay of each of the delayelements corresponds to the phase error signal. Each of the delayelements generates a respective phase of the clock signal generated bythe voltage controlled oscillator. If the voltage controlled oscillatorgenerates multi-phased signals, the frequency multiplier may be a clockserializer that transitions the output clock signal between two levelsresponsive to each transition of any of the phases of the clock signalfrom the respective delay elements.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of one type of conventional phase-lock loopcircuit.

FIG. 2 is a block diagram of another type of conventional phase-lockloop circuit.

FIG. 3 is a block diagram of the phase-lock loop of FIG. 2 after beingannotated to show various noise sources.

FIG. 4 is a graph showing the effect on an output signal from thephase-lock loop of FIG. 2 of the noise sources shown in FIG. 3.

FIG. 5 is a block diagram of a phase-lock loop circuit according to oneembodiment of the invention.

FIG. 6 is a block diagram of the phase-lock loop of FIG. 5 after beingannotated to show various noise sources.

FIG. 7 is a graph showing the effect on an output signal from thephase-lock loop of FIG. 5 of the noise sources shown in FIG. 6.

FIG. 8 is a block diagram of a phase-lock loop circuit according toanother embodiment of the invention.

FIG. 9 is a block diagram of a phase-lock loop circuit according toanother embodiment of the invention.

FIG. 10 is a schematic diagram of a clock serializer circuit that can beused in the phase-lock loop circuit of FIG. 9.

FIG. 11 is a timing diagram showing the signals applied to and generatedby the clock serializer circuit of FIG. 10.

FIG. 12 is a block diagram of a phase-lock loop circuit according tostill another embodiment of the invention.

FIG. 13 is a block diagram of a memory device using phase-lock loopsaccording to the present invention to generate write data and read datastrobe signals for strobing data bits into and out of the memory device.

FIG. 14 is a block diagram of one embodiment of a computer system usingthe memory device of FIG. 13 or some other embodiment of a memory devicein accordance with the invention.

DETAILED DESCRIPTION

One embodiment of a phase-lock loop circuit 40 for generating an outputclock signal CLK_(OUT) from an input clock signal CLK_(IN) in accordancewith the present invention is shown in FIG. 5. The phase-lock loop 40 issimilar in structure and operation to the phase-lock loop 10 of FIG. 1.Therefore, in the interest of brevity, identical components have beenprovided with the same reference numerals, and an explanation of theirfunction and operation will not be repeated. The phase-lock loop 40differs from the phase-lock loops 10, 30 by including a frequencymultiplier 44 in the signal path from the VCO 20 to the phase detector12. Also, the signal V_(OUT) generated by the phase-lock loop 40 istaken at the output of the frequency multiplier 44 rather than at theoutput of the VCO 20 as in the phase-lock loop 30 of FIG. 2. Thefrequency multiplier 44 is programmable to multiply the frequency of thesignal at the output of the VCO 20 by any integer value N. Therefore, ifthe signal at the output of the VCO 20 has a frequency of F₀, the signalCLK_(OUT) fed back to the phase detector 12 will have a frequency ofN*F₀.

In operation, the closed loop nature of the phase-lock loop 40 willcause the V_(CON) signal to have a value that ensures that the frequencyof the CLK_(OUT) signal fed back to the phase detector 12 to have afrequency that is equal to the frequency of the CLK_(IN) signal that isalso applied to the phase detector 12. Thus, if the CLK_(IN) signal hasa frequency of F_(IN), the frequency N*F₀ of the CLK_(OUT) signal fedback to the phase detector 12 will also be F_(IN), i.e., N*F₀=F_(IN).Solving this equation for F₀, it can be seen that F₀=F_(IN)/N, i.e., thesignal at the output of the VCO 20 will have a frequency that is thefrequency of the CLK_(IN) signal reduced by a factor of N, although theCLK_(OUT) signal will have a frequency that is equal to the frequency ofthe CLK_(IN) signal.

The advantage of the phase-lock loop 40 is that the operating frequencyof the VCO 12 is reduced by a factor of N, while the frequency of theCLK_(OUT) signal is maintained at the same high frequency as thefrequency of the CLK_(IN) signal. Since the phase detector 12 is stillreceiving the same high frequency signals, the harmonic components ofthe V_(E) signal generated at its output still relatively high eventhough the VCO 12 is operating at a much lower frequency, thereby makingit easier for the loop filter 16 to filter the high frequencycomponents. Also, the high frequency of the CLK_(IN) and CLK_(OUT)signals applied to the phase detector 12 allows the phase lock loop 40to achieve lock substantially sooner than could be achieved if thesignals applied to the phase detector 12 had a frequency commensuratewith the operating frequency of the VCO 20. The phase lock loop 40 alsohas the advantage of reducing the effect on the output signal CLK_(OUT)of phase noise in the input signal CLK_(IN), as shown in FIG. 6. FIG. 6shows the phase-lock loop 40 of FIG. 5 to which the previously describednoise sources θ_(N1), θ_(N2), and θ_(N3) have been added. Also, asbefore, the gain of the phase detector 12 is shown as K_(Φ), thetransfer function of the loop amplifier 14 is shown as Z_(F)(S), and thetransfer function of the VCO 20 is shown as K_(VCO)/S. The open loopgain G(S) of the phase-lock loop 40 is again given by the formulaG(S)=K_(Φ)Z_(F)(S)K_(VCO)/S. The transfer function between all of thesenoise sources and the output signal CLK_(OUT), can be expressed by thefollowing formulae:H _(N1)(S)=(G(S)/N)/(1+G(S))  (Graph 1)H _(N2)(S)=K _(VCO) /NS(1+G(S))  (Graph 2)H _(N3)(S)=1/(1+G(S))  (Graph 3)

Graphs for these formulae are shown in FIG. 7. As can be seen bycomparing FIG. 7 to FIG. 4, the effects on the output signal CLK_(OUT)of all of the noise sources except for the VCO noise are significantlyreduced.

Although the CLK_(OUT) signal is shown in FIG. 5 as being coupled to thephase detector 12 directly from the output of the frequency multiplier44, it may alternatively be coupled to the to the phase detector 12through a clock tree as shown in the phase lock loop 50 FIG. 8. Again,since the phase-lock loop 50 is similar in structure and operation tothe phase-lock loop 40 of FIG. 5, identical components have beenprovided with the same reference numerals, and an explanation of theirfunction and operation will not be repeated. The phase-lock loop 50includes a clock tree 52 through which the CLK_(OUT) signal is coupled.The clock tree 52 includes a branch 54 that is coupled to a data outputlatch 56 that receives a data bit DATA and applies the data bit DATA toa data bus terminal 58 responsive to transition of the CLK_(OUT) signal.By coupling the CLK_(OUT) signal to the phase detector 12 from the clocktree 52, the phase-lock loop 50 insures that the data bit DATA bit iscoupled to the data bus terminal 58 in synchronism with the CLK_(IN)signal.

A phase-lock loop 70 according to one embodiment of the invention isshown in greater detail in FIG. 9. The phase-lock loop 70 includes aphase detector 72 that receives a CLK_(IN) signal and a feedback clocksignal CLK_(FB). The phase detector 72 includes an up/down controlcircuit 74 that generates either a “DOWN” signal to decrease thefrequency of a CLK_(OUT) signal output from a clock tree 76 or an “UP”signal to increase the frequency of the CLK_(OUT) signal output from aclock tree 76. The phase detector 72 also includes a charge pump 78 thatreceives the DOWN and UP signals. Basically, the charge pump 78generates an error voltage V_(E) that increases in magnitude responsiveto the UP signal, and decreases in magnitude responsive to the DOWNsignal.

The up/down control circuit 74 includes a first flip-flop 80 that isclocked by the CLK_(FB) signal, and a second flip-flop 82 that isclocked by the CLK_(IN) signal. The supply voltage V_(CC) is coupled toboth of the flip-flops 80, 82. Thus, the DOWN signal is generatedwhenever the CLK_(FB) signal transitions high, and the UP signal isgenerated whenever the CLK_(IN) signal transitions high. However, theDOWN and UP signals are applied to an AND gate 84, which couples a resetsignal through a driver 86 to reset terminals of the flip-flops 80, 82.Therefore the flip-flop 80 is set to generate the DOWN signal only untilthe UP signal is generated, and the flip-flop 82 is set to generate theUP signal only until the DOWN signal is generated. The duration of theDOWN signal is thus substantially equal to the time that the phase ofthe CLK_(FB) signal leads the phase of the CLK_(IN) signal, and theduration of the UP signal is substantially equal to the time that thephase of the CLK_(FB) signal lags the phase of the CLK_(IN) signal.

The error signal V_(E) generated by the phase detector is applied to aloop filter 90, which is formed by a low-pass filter formed by acapacitor 92 that increasingly attenuates the error signal V_(E) as afunction of frequency and a series combination of a capacitor 94 andresistor 96 that increasingly attenuates the error signal V_(E) as afunction of frequency only until the impedance of the capacitor 94 issubstantially equal to the impedance of the resistor 96.

The loop filter 90 is coupled to the input of a self-biasing circuit 100that generates a pair of control voltages V_(CON+) and V_(CON−) that areapplied to respective control inputs of a ring oscillator 102. The ringoscillator 102 includes 4 delay stages 104 a-d each of which includes anon-inverting input, an inverting input and inverting and non-invertingoutputs, in addition to the + and − control inputs. The delay stages 104a-d are coupled in series with each other and from the last delay stage104 d to the first delay stage 104 a with each inverting output coupledto a non-inverting input, and each non-inverting output coupled to aninverting input. Insofar as there are an even number of delay stages 104a-d, the delay stages 104 a-d are unstable and therefore oscillate at afrequency that is a function by the propagation delay through each ofthe stages 104 a-d. The propagation delay through each of the stages iscontrolled by the V_(CON+) and V_(CON−) control voltages that areapplied to + and − control inputs, respectively, of the delay stages 104a-d. Therefore, the delay stages 104 a-d operate at a frequency that isdetermined by the V_(CON+) and V_(CON−) control voltages.

The outputs of each of the delay stages 104 a-d are coupled to arespective buffer 106 a-d. The buffers 106 collectively generate fourclock signals and their compliments, which are labeled CK0-CK7. Theseclock signals are applied to an 8:1 serializer circuit 110 thatgenerates an output clock signal CLK_(OUT) that is applied to the clocktree 76. Significantly, the CLK_(OUT) signal generated by the serializercircuit 110 has a frequency that is four times the operating frequencyof the ring oscillator 102. The serializer circuit 110 thus functions asthe frequency multiplier 44 used in the phase-lock loops 40, 50 of FIGS.5 and 8, respectively. The ring oscillator 102 and serializer circuit110 therefore generate a relatively high frequency clock signal whilethe ring oscillator 102 consumes the relatively low power resulting fromgenerating a relatively low frequency clock signal.

The CLK_(OUT) signal generated by the serializer circuit 110 is coupledfrom a location in the clock tree 76 to the phase detector 72 preferablythrough an I/O model circuit 112. The I/O model circuit 112 is a delaycircuit that compensates for any delay of the CLK_(OUT) signal or asignal strobed by the CLK_(OUT) signal downstream from the locationwhere the CLK_(OUT) signal is coupled from the clock tree 76. Forexample, if the CLK_(OUT) signal is coupled from the clock tree 76 atthe input to the latch 56 (FIG. 8), the I/O model circuit wouldcompensate for the delay of the DATA bit as it is coupled from the latch56 to the data bus terminal 58.

One embodiment of a clock serializer circuit 120 that can be used as theclock serializer circuit 110 of FIG. 9 is shown in FIG. 10. Theserializer circuit includes four parallel branches 122 a-d of first andsecond NMOS transistors 124, 126 coupled in series, which have beenprovided with odd-numbered designations for reasons that will becomeapparent later. The serializer circuit also includes four parallelbranches 130 a-d of first and second NMOS transistors 132, 134 coupledin series, which have been provided with even-numbered designations. Thetransistor branches 122 are coupled to the drain of a first PMOStransistor 140, and the transistor branches 130 are coupled to the drainof a second PMOS transistor 142. The PMOS transistors 140, 142 arebiased ON by their gates being coupled to ground. The drains of the PMOStransistors 140, 142 constitute intermediate complimentary output clocksignals CLK and CLK*.

The CLK and CLK* signals are coupled to a gain stage 150 that includes apair of PMOS transistors 152, 154 biased ON by having their gatescoupled to ground, and a pair of NMOS transistors 156, 158 biased ON byhaving their gates coupled to a supply voltage V_(CC). The CLK signal iscoupled to the gate of a first NMOS switching transistor 160, and theCLK* signal is coupled to the gate of a second NMOS switching transistor162, which generates the CLK_(OUT) signal at its drain. If desired acomplimentary CLK_(OUT) signal can be generated at the drain of the NMOStransistor 160.

The operation of the clock serializer circuit 120 will now be explainedwith reference to the timing diagram of FIG. 11. The phases of theCK0-CK7 signals form 8 discrete time periods, which have been labeled assuch in FIG. 11. The numbers of these time periods correspond to thenumbers that have been used to label the transistor branches 122, 130 inFIG. 10. It can be seen that the transistors in each numbered branch areboth ON during the correspondingly numbered time. For example, thetransistors 124, 126 in the branch 122 a are both ON during the timeperiod “1” when the CK0 and CK5 signals are both high. Similarly, thetransistors 132, 134 in the branch 130 a are both ON during the timeperiod “2” when the CK1 and CK6 signals are both high. As a result, theCLK_(OUT) signal from the serializer circuit 110 toggles on everytransition of any of the CK0-CK7 signals so that it has 4 times thefrequency of the CK0-CK7 signals, as shown in FIG. 11.

Another embodiment of a phase-lock loop 170 according to the presentinvention is shown in FIG. 12. The phase-lock loop 170 uses many of thecomponents used in the phase-lock loop 70 of FIG. 9 and, therefore, anexplanation of their function and operation will not be repeated. Thephase-lock loop 170 differs from the phase-lock loop 70 by coupling the4 phased clock signals CK0-CK3 to the clock tree 76 where they can beused for various functions where a multi-phased clock signal is useful.For example, they can be used to coupled 4 bits of data to each ofseveral data bus terminals. In either case, the CK0-Ck3 signals arecoupled from the clock tree 76 to the serializer circuit 110, whichgenerates a single CLK signal that is coupled to the I/O model circuit112 and used as described above with reference to FIG. 9.

As mentioned above, the phase-lock loops of the present invention can beused to generate a read data strobe and a write data strobe in a memorydevice. With reference to FIG. 13, a synchronous dynamic random accessmemory (“SDRAM”) 200 includes a command decoder that controls theoperation of the SDRAM 200 responsive to high-level command signalsreceived on a control bus 206 and coupled thorough input receivers 208.These high level command signals, which are typically generated by amemory controller (not shown in FIG. 13), are a clock enable signalCKE*, a clock signal CLK, a chip select signal CS*, a write enablesignal WE*, a row address strobe signal RAS*, a column address strobesignal CAS*, and a data mask signal DQM, in which the “*” designates thesignal as active low. The command decoder 204 generates a sequence ofcommand signals responsive to the high level command signals to carryout the function (e.g., a read or a write) designated by each of thehigh level command signals. These command signals, and the manner inwhich they accomplish their respective functions, are conventional.Therefore, in the interest of brevity, a further explanation of thesecommand signals will be omitted.

The SDRAM 200 includes an address register 212 that receives rowaddresses and column addresses through an address bus 214. The addressbus 214 is generally coupled through input receivers 210 and thenapplied to a memory controller (not shown in FIG. 14). A row address isgenerally first received by the address register 212 and applied to arow address multiplexer 218. The row address multiplexer 218 couples therow address to a number of components associated with either of twomemory banks 220, 222 depending upon the state of a bank address bitforming part of the row address. Associated with each of the memorybanks 220, 222 is a respective row address latch 226, which stores therow address, and a row decoder 228, which decodes the row address andapplies corresponding signals to one of the arrays 220 or 222. The rowaddress multiplexer 218 also couples row addresses to the row addresslatches 226 for the purpose of refreshing the memory cells in the arrays220, 222. The row addresses are generated for refresh purposes by arefresh counter 230, which is controlled by a refresh controller 232.The refresh controller 232 is, in turn, controlled by the commanddecoder 204.

After the row address has been applied to the address register 212 andstored in one of the row address latches 226, a column address isapplied to the address register 212. The address register 212 couplesthe column address to a column address latch 240. Depending on theoperating mode of the SDRAM 200, the column address is either coupledthrough a burst counter 242 to a column address buffer 244, or to theburst counter 242 which applies a sequence of column addresses to thecolumn address buffer 244 starting at the column address output by theaddress register 212. In either case, the column address buffer 244applies a column address to a column decoder 248.

Data to be read from one of the arrays 220, 222 is coupled to the columncircuitry 254, 255 for one of the arrays 220, 222, respectively. Thedata is then coupled through a data output register 256 and data outputdrivers 257 to a data bus 258. The data output drivers 257 apply theread data to the data bus 258 responsive to a read data strobe generatedby a phase-lock loop 259 in accordance with the present invention. Thephase-lock loop 259 receives a periodic CLK_(IN) signal and generates aCLK_(OUT) signal, as explained above. The CLK_(OUT) signal is used as aread data strobe so that the read data are coupled to the data bus 258in substantially in phase with the CLK_(IN) signal.

Data to be written to one of the arrays 220, 222 are coupled from thedata bus 258 through data input receivers 260 to a data input register261. The write data are coupled from the data bus 258 responsive to theCLK_(OUT) signal, which is used as a write data strobe. As a result, thewrite data are coupled into the SDRAM 200 from the data bus 258substantially in phase with the CLK_(IN) signal. Alternatively, thephase-lock loop can be designed so that the phase detector used thereingenerates a minimum error signal when the CLK_(FB) signal is thequadrature of the CLK_(IN) signal using techniques that are well knownto one skilled in the art so that the write data are coupled into theSDRAM 200 at the center of a “data eye” corresponding to the CLK_(IN)signal. In either case, the write data are coupled to the columncircuitry 254, 255 where they are transferred to one of the arrays 220,222, respectively. A mask register 264 responds to a data mask DM signalto selectively alter the flow of data into and out of the columncircuitry 254, 255, such as by selectively masking data to be read fromthe arrays 220, 222.

FIG. 14 shows an embodiment of a computer system 300 that may use theSDRAM 200 or some other memory device that used one of the embodimentsof a phase-lock loop described above or some other embodiment of theinvention. The computer system 300 includes a processor 302 forperforming various computing functions, such as executing specificsoftware to perform specific calculations or tasks. The processor 302includes a processor bus 304 that normally includes an address bus, acontrol bus, and a data bus. In addition, the computer system 300includes one or more input devices 314, such as a keyboard or a mouse,coupled to the processor 302 to allow an operator to interface with thecomputer system 300. Typically, the computer system 300 also includesone or more output devices 316 coupled to the processor 302, such outputdevices typically being a printer or a video terminal. One or more datastorage devices 518 are also typically coupled to the processor 302 tostore data or retrieve data from external storage media (not shown).Examples of typical storage devices 318 include hard and floppy disks,tape cassettes, and compact disk read-only memories (CD-ROMs). Theprocessor 302 is also typically coupled to a cache memory 326, which isusually static random access memory (“SRAM”) and to the SDRAM 200through a memory controller 330. The memory controller 330 includes anaddress bus coupled to the address bus 214 (FIG. 13) to couple rowaddresses and column addresses to the SDRAM 200. The memory controller330 also includes a control bus that couples command signals to thecontrol bus 206 of the SDRAM 200. The external data bus 258 of the SDRAM200 is coupled to the data bus of the processor 302, either directly orthrough the memory controller 330.

From the foregoing it will be appreciated that, although specificembodiments of the invention have been described herein for purposes ofillustration, various modifications may be made without deviating fromthe spirit and scope of the invention. Accordingly, the invention is notlimited except as by the appended claims.

1. A phase-lock loop generating an output clock signal responsive to aninput clock signal, comprising: a phase detector having a first inputreceiving the input clock signal and a second input receiving a feedbackclock signal, the phase detector generating a phase error signal at anoutput that is indicative of a relationship between the phase of theinput clock signal and the phase of the feedback clock signal; a voltagecontrolled ring oscillator having an input coupled to the output of thephase detector, the voltage controlled oscillator comprising a pluralityof delay elements that are coupled to each other in a ring in anunstable relationship, each of the delay elements having a respectivedelay control terminal that controls the signal propagation delaythrough the delay element, the delay control terminal of each of thedelay elements being coupled to the output of the phase detector so thatthe signal propagation delay of each of the delay elements correspondsto the phase error signal and so that a clock signal generated at anoutput of the voltage controlled oscillator has a frequencycorresponding the phase error signal and each of the delay elementsgenerate a respective phase of the clock signal generated by the voltagecontrolled oscillator; a clock tree coupled to the voltage controlledoscillator to receive the phases of the clock signal generated by therespective delay elements; and a frequency multiplier having an inputcoupled to receive the clock signal from the output of the voltagecontrolled oscillator, the frequency multiplier generating the feedbackclock signal at an output having a frequency that is a multiple of thefrequency of the clock signal received from the output of the voltagecontrolled oscillator, the feedback clock signal at the output of thefrequency multiplier being applied to the second input of the phasedetector.
 2. The phase-lock loop of claim 1, further comprising a loopfilter coupled between the output of the phase detector and the input ofthe voltage controlled oscillator.
 3. The phase-lock loop of claim 1,further comprising a loop amplifier coupled between the output of thephase detector and the input of the voltage controlled oscillator. 4.The phase-lock loop of claim 1 wherein the feedback clock signalgenerated by the frequency multiplier has a frequency that is an integermultiple of the frequency of the clock signal received from the outputof the voltage controlled oscillator.
 5. The phase-lock loop of claim 1,further comprising a clock tree coupled to receive the feedback clocksignal from the frequency multiplier, the second input of the phasedetector being coupled to the clock tree so that the second input of thephase detector receives the feedback clock signal from the frequencymultiplier through the clock tree.
 6. The phase-lock loop of claim 1wherein the phase detector comprises: an up/down control circuit that isoperable to generate a down signal responsive to the output clock signalleading the input clock signal and an up clock signal responsive tooutput clock signal lagging the input clock signal; and a charge pumpcoupled to the up/down control circuit, the charge pump generating theerror signal with a magnitude that causes a decrease in frequency of theoutput clock signal responsive to the down signal, the charge pumpgenerating the error signal with a magnitude that causes an increase infrequency of the output clock signal responsive to the up signal.
 7. Thephase-lock loop of claim 6 wherein the up/down control circuitcomprises: a first flip-flop having a clock input coupled to receive theoutput clock signal, the first flip-flop generating the down signal atan output, the first flip-flop having a first reset terminal; a secondflip-flop having a clock input coupled to receive the input clocksignal, the second flip-flop generating the up signal at an output, thesecond flip-flop having a second reset terminal; and a logic circuithaving a first input coupled to the output of the first flip-flop, asecond input coupled to the output of the second flip-flop, and anoutput coupled to the first and second reset terminals so that the upsignal is generated only until the down signal is generated, and thedown signal is generated only until the up signal is generated.
 8. Amemory device, comprising: a row address circuit operable to receive anddecode row address signals applied to external address terminals of thememory device; a column address circuit operable to receive and decodecolumn address signals applied to the external address terminals; amemory cell array operable to store data written to or read from thearray at a location determined by the decoded row address signals andthe decoded column address signals; a data path circuit operable tocouple data signals corresponding to the data between the array and aplurality of external data terminals of the memory device, the data pathcircuit comprising a plurality of read data latches operable to applyrespective read data signals to the external data terminals of thememory device responsive to a read data strobe signal, the data pathcircuit further comprising a plurality of write data latches operable tostore respective write data signals from the external data terminals ofthe memory device responsive to a write data strobe signal; a commanddecoder operable to decode a plurality of command signals applied torespective external command terminals of the memory device, the commanddecoder being operable to generate control signals corresponding to thedecoded command signals; and a phase-lock loop, comprising: a phasedetector having a first input receiving an input clock signal and asecond input receiving a feedback clock signal, the phase detectorgenerating a phase error signal that is indicative of a relationshipbetween the phase of the input clock signal and the phase of thefeedback clock signal; a voltage controlled ring oscillator coupled toreceive the error signal from the phase detector, the voltage controlledoscillator comprising a plurality of delay elements that are coupled toeach other in a ring in an unstable relationship, each of the delayelements having a respective delay control terminal that controls thesignal propagation delay through the delay element, the delay controlterminal of each of the delay elements being coupled to the output ofthe phase detector so that the signal propagation delay of each of thedelay elements corresponds to the phase error signal and so that a clocksignal generated by the voltage controlled oscillator has a frequencythat is determined by the phase error signal and each of the delayelements generate a respective phase of the clock signal generated bythe voltage controlled oscillator; a clock tree coupled to the voltagecontrolled oscillator to receive the phases of the clock signalgenerated by the respective delay elements; and a frequency multipliercoupled to receive the clock signal from the voltage controlledoscillator, the frequency multiplier generating the feedback clocksignal from which one of the data strobe signals is generated, thefeedback clock signal having a frequency that is a multiple of thefrequency of the clock signal received from the voltage controlledoscillator.
 9. The memory device of claim 8 wherein the read data strobesignal is generated from the feedback clock signal.
 10. The memorydevice of claim 8 wherein the write data strobe signal is generated fromthe feedback clock signal.
 11. The memory device of claim 8, furthercomprising a loop filter coupled between the output of the phasedetector and the input of the voltage controlled oscillator.
 12. Thememory device of claim 8, further comprising a loop amplifier coupledbetween the output of the phase detector and the input of the voltagecontrolled oscillator.
 13. The memory device of claim 8 wherein thememory device comprises a dynamic random access memory device.
 14. Thememory device of claim 8 wherein the input clock signal comprises aclock signal that is externally coupled to the memory device.
 15. Aphase-lock loop generating an output clock signal responsive to an inputclock signal, comprising: a phase detector having a first inputreceiving the input clock signal and a second input receiving a feedbackclock signal, the phase detector generating a phase error signal at anoutput that is indicative of a relationship between the phase of theinput clock signal and the phase of the feedback clock signal; a voltagecontrolled oscillator having an input coupled to the output of the phasedetector, the voltage controlled oscillator generating a plurality ofclock signals at respective outputs that have a frequency correspondingthe phase error signal, the plurality of clock signals having respectivephases that are different from each other; and a serializer having aninput coupled to receive the plurality of clock signals from the outputof the voltage controlled oscillator, the serializer being configured togenerate the feedback clock signal by serializing the plurality of clocksignals from the output of the voltage controlled oscillator to generatethe feedback clock signal.
 16. The phase-lock loop of claim 15, furthercomprising a clock tree coupled to the voltage controlled oscillator toreceive the plurality of clock signals from the voltage controlledoscillator.
 17. The phase-lock loop of claim 15 wherein the feedbackclock signal has a frequency that is an integer multiple of thefrequency of the plurality of clock signals generated by the voltagecontrolled oscillator.
 18. The phase-lock loop of claim 15 wherein theserializer is configured to transition the feedback clock signal on eachtransition of any of the plurality of clock signal from the voltagecontrolled oscillator.
 19. The phase-lock loop of claim 15 wherein theserializer comprises: a first plurality of transistors coupled inparallel with each other between a first output node and a firstreference voltage, each of the transistors in the first plurality beingcoupled to receive a respective one of at least some of the plurality ofclock signals from the voltage controlled oscillator; and a secondplurality of transistors coupled in parallel with each other between asecond output node and a second reference voltage, each of thetransistors in the second plurality being coupled to receive arespective one of the plurality of clock signals from the voltagecontrolled oscillator that is not received by one of the transistors inthe first plurality.